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MM-400/800 series are specially designed for higher accuracy for Z axis height measurement, XY measurement, digital imaging measurement and measurement for larger size of samples. MM-400/800 series are good for broad variations of applications at Inspection and failure analysis and QA testing for Semi-conductors, FPD and Automobile parts. It is incorporate with the key performance features expected in an advanced next generation measuring microscope:
- Greater Accuracy.
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Digital Imaging and Vision Processing Metrology.
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Larger Stage for Increased Work piece Handling.
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Non Contact Z-height Measurements.
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Coordination with Data Processing Systems DP-E1. |
